The first type was water poured and stored in a perfluoroalkoxy (

The first type was water poured and stored in a perfluoroalkoxy (PFA) beaker. This water has a saturated dissolved-oxygen BAY 57-1293 datasheet concentration of approximately 9 ppm. The second type contained a very low oxygen concentration of approximately 3 ppb. We, hereafter, call these two types of water ‘saturated dissolved-oxygen water’ (SOW) and ‘low dissolved-oxygen water’ (LOW), respectively. By putting a Ge sample in a PFA container connected directly to an ultrapure water line faucet, we were able to treat samples in LOW. The change in the structure of Ge surfaces loaded with metallic particles by immersion in water in the dark was analyzed by scanning

Z IETD FMK electron microscopy (SEM, HITACHI S-4800, Hitachi Ltd., Tokyo, Japan). The other experiment

is the nanoscale machining of Ge surfaces by means of the catalytic activity of the metallic probes, using a commercial atomic force microscopy (AFM) system (SPA-400, Hitachi High-Tech Selleckchem C59 wnt Science Corporation, Tokyo, Japan) equipped with a liquid cell. It was carried out in the contact mode using two types of silicon cantilever probe from NANOWORLD (Neuchâtel, Switzerland): a bare Si cantilever and a cantilever coated with a 25-nm thick Pt/Ir layer (Pt 95%, Ir 5%). The resonant frequency and spring constant of both probes were 13 kHz and 0.2 N/m, respectively. An AFM head was covered with a box capable of shutting out external light. A conventional optical lever technique was used to detect the position of the cantilever. Ultrapure water exposed to air ambient and poured in the liquid cell contained approximately 9 ppm dissolved oxygen (SOW). We added ammonium sulfite monohydrate (JIS First Grade, NACALAI TESQUE Inc., Kyoto,

Japan) to the water in the liquid cell. Performed according to the literature [23–25], this method enabled us to obtain ultralow dissolved-oxygen water with approximately 1 ppb oxygen (LOW). Results and discussion Figure 1a shows a typical tuclazepam p-type Ge(100) surface after the deposition of Ag particles. From the figure, it is clear that the particles are well dispersed (not segregated) and almost spherical, even with the simple deposition method used. They are approximately 20 nm in diameter. After the sample was immersed and stored in SOW in the dark for 24 h, its surface structure changed markedly, as shown in Figure 1b. Namely, most of the Ag particles disappeared and pits emerged. Most of the pits formed square edges. When the sample was dipped in SOW for more 48 h (72 h in total), each pit grew as shown in Figure 1c. It is clear that the shape of the pit is an inverted pyramid with edges aligned along the <110> direction. We confirmed in another experiment that (1) a metallic particle usually resided at the bottom of the pit [21], and (2) inverted pyramidal pits were formed on the n-type Ge sample as well. Figure 1d shows an SEM image of a p-type Ge(100) surface loaded with Pt particles.

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